Keysight Solution Brochure 5992-1446EN | Digital Interconnect Test System Reference Solution

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Solution Brochure 5992-1446EN | Digital Interconnect Test System Reference Solution
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Solution Brochure :: Digital Interconnect Test System Reference Solution Accelerate your...

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Solution Brochure :: Digital Interconnect Test System Reference Solution

Accelerate your S-parameter measurements with a full 32-port vector network analyzer configured for high-speed cable testing. Test any linear passive interconnect faster and easier, including backplanes, connectors and PCBs. Plus, reduce your test time by 50%, with customized software included with your solution.

High-Speed Digital Design Test Challenges
With the increase in data rates, today's digital communication standards continue to evolve. The trend of faster data transmission creates the need for higher signal integrity of interconnects. Especially susceptible components are cable assemblies, backplanes, printed circuit boards and connectors. With the adoption of multiple serial lanes for higher throughput, multiport S-parameter measurements are needed to characterize return loss, insertion loss and various crosstalk between the data lanes. USB type-C, for example, requires a 12-port S-parameter measurement for compliance testing of cable assemblies. An increase in port density on a device under test (DUT) requires you to address multiple test challenges. Fast and accurate analysis of interconnect performance in both time and frequency domains are also becoming more critical than ever before.

The Digital Interconnect Test System Reference Solution
The Digital Interconnect Test System Reference Solution enables full signal integrity characterization of multiport interconnect products for high-speed digital applications. A vector network analyzer (VNA) with a maximum of 32-ports, can be configured within a single PXI chassis. This enables you to obtain a fully populated 1,024 element S-parameter matrix within 20 seconds.
The Keysight Physical Layer Test System (PLTS) Software lets you perform multi-domain analysis including time-domain, frequency-domain or eye diagram measurements. A custom test Application Program Interface (API) to communicate with the PLTS is provided to enable faster and easier automated testing for production, to meet specific test application needs.

To facilitate evaluation and integration in your test environment, you can use the test code examples provided that were designed to increase test throughput with a user-friendly graphical user interface.

Solution Brochure :: Digital Interconnect Test System Reference Solution

Accelerate your S-parameter measurements with a full 32-port vector network analyzer configured for high-speed cable testing. Test any linear passive interconnect faster and easier, including backplanes, connectors and PCBs. Plus, reduce your test time by 50%, with customized software included with your solution.

High-Speed Digital Design Test Challenges
With the increase in data rates, today's digital communication standards continue to evolve. The trend of faster data transmission creates the need for higher signal integrity of interconnects. Especially susceptible components are cable assemblies, backplanes, printed circuit boards and connectors. With the adoption of multiple serial lanes for higher throughput, multiport S-parameter measurements are needed to characterize return loss, insertion loss and various crosstalk between the data lanes. USB type-C, for example, requires a 12-port S-parameter measurement for compliance testing of cable assemblies. An increase in port density on a device under test (DUT) requires you to address multiple test challenges. Fast and accurate analysis of interconnect performance in both time and frequency domains are also becoming more critical than ever before.

The Digital Interconnect Test System Reference Solution
The Digital Interconnect Test System Reference Solution enables full signal integrity characterization of multiport interconnect products for high-speed digital applications. A vector network analyzer (VNA) with a maximum of 32-ports, can be configured within a single PXI chassis. This enables you to obtain a fully populated 1,024 element S-parameter matrix within 20 seconds.
The Keysight Physical Layer Test System (PLTS) Software lets you perform multi-domain analysis including time-domain, frequency-domain or eye diagram measurements. A custom test Application Program Interface (API) to communicate with the PLTS is provided to enable faster and easier automated testing for production, to meet specific test application needs.

To facilitate evaluation and integration in your test environment, you can use the test code examples provided that were designed to increase test throughput with a user-friendly graphical user interface.

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