Keysight Application Note 5992-3166EN | Laser Diode Characterization and Its Challenges

Application Note 5992-3166EN | Laser Diode Characterization and Its Challenges
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Keysight App-Note :: Laser Diode Characterization and Its Challenges.

What is Light-Current-Voltage (L-I-V) Test?
The light-current-voltage (L-I-V) sweep test is a fundamental measurement that determines the operating characteristics of a laser diode (LD). Usually, a “laser diode module” is a combination of a laser diode and a photo detector (PD). The PD monitors the light output and provides feedback to control the laser power. It is an important process to determine the quality and performance of the laser diode through validating the “performance linearity” before it passes through production and goes to market.

In the L-I-V test, a sweep current from μA to mA is applied to the laser diode. The intensity of the resulting emitted laser is measured using a photo detector. The output current of the photo detector is compared with the input current values. The intensity of the resulting emitted laser is calculated based on the measured photo detector current. In addition, the voltage drop across the laser diode is measured simultaneously. As you can imagine, this requires multiple instruments to be connected to the two separate devices—the laser diode and the photo detector (Figure 1). It is critical for the multiple instruments to be synchronized with each other in order to get accurate results.

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