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Keysight - 5991-1475EN - Catalog // Impedance and Network Analysis

Keysight 5991-1475EN Catalog // Impedance and Network Analysis

Catalog // Impedance and Network Analysis 2014. You face increasing technical and operational complexity. Keysight Technologies, Inc. measurement and application expertise help...
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Catalog // Impedance and Network Analysis

Catalog // Impedance and Network Analysis 2014.

You face increasing technical and operational complexity. Keysight Technologies, Inc. measurement and application expertise helps you anticipate these growing complexities. Keysight impedance analyzers, LCR meters and ENA series network analyzers support various applications for impedance and network analysis. This catalog provides the information of unique and new solutions that we cannot tell all in product brochures. Please ind the solution that its your case or helps your similar test challenge in this catalog, and contact Keysight to accelerate your business.

Table of Contents

Circuit measurement

  • DC-DC converter and Power Distribution Network (PDN) measurements | Page 4
  • PSRR in Linear Regulator/Low Dropout (LDO) Regulator | Page 5
  • OP amp circuit measurements | Page 6
  • RFID tag measurements | Page 7
  • Wireless power transmission measurement and simulation | Page 8
  • In-circuit impedance measurements (grounded measurements) | Page 9

Component measurement

  • Passive intermodulation (PIM) measurement | Page 10
  • Cable and connector assembly test for USB, HDMI, SATA and DisplayPort | Page 11
  • Tx (source) and Rx (receiver) test for SATA and MIPI | Page 12
  • Device characterization for PCB quality control | Page 13
  • Automotive ethernet test and debug | Page 14
  • Automotive antenna test | Page 15
  • RF amplifier measurements | Page 16
  • High-gain amplifier measurements with low power signal | Page 17
  • Pulsed S-parameter measurements | Page 18
  • RF coaxial cable measurements | Page 19
  • LAN/telecom cable measurements | Page 20
  • High-rejection ilter measurements | Page 21
  • Capacitance characteristics of liquid crystal cell | Page 22
  • MEMS/NEMS device modeling, failure analysis and process control | Page 23
  • EMC component measurement under actual operating conditions | Page 24
  • Production test for inductor, EMI filter, capacitor and register | Page 25
  • On-chip device measurements with probing system | Page 26
  • Mixer and converter measurement | Page 27
  • Multiport device measurement (up to 40-port) | Page 28

On-wafer measurement

  • On-wafer C-V characterization of MOS device | Page 29
  • On-wafer device characterization from low frequency to microwave | Page 30

Material measurement

  • Solid and liquid material measurements with test fixtures | Page 31
  • RF material measurements using dielectric probe | Page 32
  • Phantom material evaluation for Specific Absorption Rate (SAR) test | Page 33
  • Permittivity measurements of PCB and substrate materials | Page 34
  • Quality evaluation of foods by dielectric measurement | Page 35

General purpose

  • Component impedance and S-parameters measurement | Page 36
  • Component impedance measurements (most accurate over broad impedance range) | Page 37
  • Temperature characteristic evaluations of RF components and materials | Page 38

Appendix

  • 1. Product based application list | Page 39
  • 2. Product replacement guide | Page 41
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Catalog // Impedance and Network Analysis 2014.

You face increasing technical and operational complexity. Keysight Technologies, Inc. measurement and application expertise helps you anticipate these growing complexities. Keysight impedance analyzers, LCR meters and ENA series network analyzers support various applications for impedance and network analysis. This catalog provides the information of unique and new solutions that we cannot tell all in product brochures. Please ind the solution that its your case or helps your similar test challenge in this catalog, and contact Keysight to accelerate your business.

Table of Contents

Circuit measurement

  • DC-DC converter and Power Distribution Network (PDN) measurements | Page 4
  • PSRR in Linear Regulator/Low Dropout (LDO) Regulator | Page 5
  • OP amp circuit measurements | Page 6
  • RFID tag measurements | Page 7
  • Wireless power transmission measurement and simulation | Page 8
  • In-circuit impedance measurements (grounded measurements) | Page 9

Component measurement

  • Passive intermodulation (PIM) measurement | Page 10
  • Cable and connector assembly test for USB, HDMI, SATA and DisplayPort | Page 11
  • Tx (source) and Rx (receiver) test for SATA and MIPI | Page 12
  • Device characterization for PCB quality control | Page 13
  • Automotive ethernet test and debug | Page 14
  • Automotive antenna test | Page 15
  • RF amplifier measurements | Page 16
  • High-gain amplifier measurements with low power signal | Page 17
  • Pulsed S-parameter measurements | Page 18
  • RF coaxial cable measurements | Page 19
  • LAN/telecom cable measurements | Page 20
  • High-rejection ilter measurements | Page 21
  • Capacitance characteristics of liquid crystal cell | Page 22
  • MEMS/NEMS device modeling, failure analysis and process control | Page 23
  • EMC component measurement under actual operating conditions | Page 24
  • Production test for inductor, EMI filter, capacitor and register | Page 25
  • On-chip device measurements with probing system | Page 26
  • Mixer and converter measurement | Page 27
  • Multiport device measurement (up to 40-port) | Page 28

On-wafer measurement

  • On-wafer C-V characterization of MOS device | Page 29
  • On-wafer device characterization from low frequency to microwave | Page 30

Material measurement

  • Solid and liquid material measurements with test fixtures | Page 31
  • RF material measurements using dielectric probe | Page 32
  • Phantom material evaluation for Specific Absorption Rate (SAR) test | Page 33
  • Permittivity measurements of PCB and substrate materials | Page 34
  • Quality evaluation of foods by dielectric measurement | Page 35

General purpose

  • Component impedance and S-parameters measurement | Page 36
  • Component impedance measurements (most accurate over broad impedance range) | Page 37
  • Temperature characteristic evaluations of RF components and materials | Page 38

Appendix

  • 1. Product based application list | Page 39
  • 2. Product replacement guide | Page 41

Nach oben gehen.