• Oszilloskope

    Multifunktionssysteme / Universalmessgeräte

    Wissenswertes Oszilloskope
  • |
  • Netzgeräte
    Stromversorgung PSI9000T-SerieWissenswertes zu Labor-Stromversorgungen
  • |
  • Labor-Messgeräte
    350 MHz Oszilloskop gratis
    Applikationschriften Messtechnik
  • |
  • Multimeter
    Truevolt-Multimeter 344xxA
    Wissenswertes Multimeter
  • |
  • Thermografie
    Stationäre Wärmebildkamera ETS320

    Wissenswertes Thermografie
  • |
  • Prüfgeräte

    Frühjahrs-Aktion
    Wissenswertes Prüfgeräte VDE

  • |
  • Tools
    Positionierhilfe / Klemmsystem
    Wissenswertes Löten und Absaugen
  • |
  • Seminare
    Buchen Sie jetzt die letzten Plätze!
    Seminare von dataTec
  • |
  • Info
Keysight - E2666B - High speed USB device test fixture kit

Keysight E2666B High speed USB device test fixture kit

Keysight E2666B | USB 2.0 Hi-speed Device Test Fixture Kit for MSOX4154A, DSOX4154A InfiniiVision X-Series oscilloscopes. To perform the Signal Quality test on USB 2.0 hi-speed...
Weitere Produktdetails unten ...
High speed USB device test fixture kit

Keysight E2666B | USB 2.0 Hi-speed Device Test Fixture Kit for MSOX4154A, DSOX4154A InfiniiVision X-Series oscilloscopes.

To perform the Signal Quality test on USB 2.0 hi-speed devices, Keysight recommends using the E2666B USB 2.0 hi-speed device test fixture kit along with the DSOXUSBSQ USB 2.0 Signal Quality test option on a 1.5 GHz bandwidth 4000 X-Series oscilloscope. Testing hi-speed devices using a programmed test pattern based on USB-IF standards only requires that you connect the D+ and D- signals from the test fixture to the oscilloscope's input channels using SMA cabling along with the appropriate SMA-to-BNC adapters.

Bestellbar.
EUR 430,00 + MwSt   
Menge:
Menge:
   

Keysight E2666B | USB 2.0 Hi-speed Device Test Fixture Kit for MSOX4154A, DSOX4154A InfiniiVision X-Series oscilloscopes.

To perform the Signal Quality test on USB 2.0 hi-speed devices, Keysight recommends using the E2666B USB 2.0 hi-speed device test fixture kit along with the DSOXUSBSQ USB 2.0 Signal Quality test option on a 1.5 GHz bandwidth 4000 X-Series oscilloscope. Testing hi-speed devices using a programmed test pattern based on USB-IF standards only requires that you connect the D+ and D- signals from the test fixture to the oscilloscope's input channels using SMA cabling along with the appropriate SMA-to-BNC adapters.


nach oben